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General Information
Editor-in-chief
Prof. Wael Badawy
Department of Computing and Information Systems Umm Al Qura University, Canada
I'm happy to take on the position of editor in chief of IJCTE. We encourage authors to submit papers concerning any branch of computer theory and engineering.
IJCTE 2013 Vol.5(3): 562-566 ISSN: 1793-8201
DOI: 10.7763/IJCTE.2013.V5.750

Logic Circuit Design Based on Series-Connected CMOS-NDR Circuit

Kwang-Jow Gan, Zhen-Kai Kao, Cher-Shiung Tsai, Din-Yuen Chan, and Jian-Syong Huang
Abstract—In this paper, we propose a MOS-BJT-NDR circuit, which can show the negative-differential-resistance (NDR) characteristic in its current-voltage (I-V) curve. This NDR circuit is composed of standard Si-based metal-oxide-semiconductor field-effect transistor (MOS) and bipolar junction transistor (BJT). Therefore, we can implement the applications using the standard CMOS process. We demonstrate the design of some logic circuits using the series-connected CMOS-NDR circuit based on the monostable-bistable transition logic element (MOBILE) theory. This logic circuit is designed based on the standard 0.18 μm CMOS process.

Index Terms—CMOS process, logic circuit, monostable–bistable transition logic element (MOBILE), negative-differential-resistance.

K. J. Gan is with the Department of Electrical Engineering, National Chia-Yi University, No. 300 Syuefu Rd, Chiayi City 60004, Taiwan, ROC (e-mail: gankj@ms52.hinet.net).
Z. K. Kao, D. Y. Chan, and J. S. Huang are with the Institute of Computer Science and Information Engineering, National Chia-Yi University, No. 300 Syuefu Rd, Chiayi City 60004, Taiwan, ROC (e-mail: w770917@gmail.com, dychan@mail.ncyu.edu.tw, ybbearq@gmail.com ).
C. S. Tsai is with the Department of Electrical Engineering, Kun Shan University, 949 Da-Wan Rd, Yung-Kang City, Tainan Hsien 71003, Taiwan, ROC (e-mail: e5040@mail.ksu.edu.tw).

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Cite:Kwang-Jow Gan, Zhen-Kai Kao, Cher-Shiung Tsai, Din-Yuen Chan, and Jian-Syong Huang, "Logic Circuit Design Based on Series-Connected CMOS-NDR Circuit," International Journal of Computer Theory and Engineering vol. 5, no. 3, pp. 562-566, 2013.

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