International Journal of Computer Theory and Engineering

Editor-In-Chief: Prof. Mehmet Sahinoglu
Frequency: Quarterly
ISSN: 1793-8201 (Print), 2972-4511 (Online)
Publisher:IACSIT Press

OPEN ACCESS
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IJIET 2011 Vol.3(5): 608-616
doi: 10.7763/IJCTE.2011.V3.379

Pass Transistor Based Self-Checking Full Adder

Hamdi Belgacem1 , Khedhiri Chiraz2 , Tourki Rached3

  • 1Electronic & microelectronic‟s LAB, Monastir, Tunisia. PH.D. in Microelectronics from INP Grenoble (France). Assistant Professor at ISSAT Sousse, Tunisia. His main areas of interest are: IC design, Test, Built In self Test, DFT tools, self-checking and Fault tolerant systems.
  • 2Electronic & microelectronic‟s LAB, Monastir. Pursuing PH.D. in Electronic & microelectronic design at Tunis University, Tunisia.
  • 3university (Tunisia)

Abstract

Self-checking designs will gain increasing interest in industrial applications if they satisfy the following requirements: high fault coverage and reduced hardware cost with reduced design effort. The aim of this work is to contribute to reach these requirements for the design of self-checking adders/ALUs. In this paper, we present efficient self-checking implementations for adder schemes using the dual duplication code. Among the known self-checking adder designs, the dual duplicated scheme has the advantage to be totally self-checking for single faults. The drawback of this scheme is that it requires generally the maximum hardware overhead. In this work, we propose a low cost implementation for self-checking adder. The proposed design is based on a novel differential XOR gate implemented in CMOS pass transistor logic, and performed with only four transistors.

Keywords

  • Totally
  • self-checking
  • circuits;
  • self-checking
  • adder;
  • differential
  • XOR;
  • CMOS
  • Logic
  • Styles;
  • CMOS
  • pass
  • transistor
  • logic
379-JG523

How to Cite

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Hamdi Belgacem, Khedhiri Chiraz, and Tourki Rached, "Pass Transistor Based Self-Checking Full Adder," International Journal of Computer Theory and Engineering, vol. 3, no. 5, pp. 608-616, 2011. https://doi.org/10.7763/IJCTE.2011.V3.379

Copyright & License

Copyright © 2011 by the authors. This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).

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